SEPARATION METHOD OF INTEGRATED CIRCUITS AS TO RELIABILITY Russian patent published in 2014 - IPC G01R31/26 

FIELD: electricity.

SUBSTANCE: invention relates to electrical engineering, namely to methods providing quality and reliability of integrated circuits (IC), both logic and analogue ones. The essence of the invention consists in the fact that on a representative sample there performed is measurement of critical supply voltage (CSV) before and after the burn-in test (BT) with the duration of up to 100 h and after thermal annealing with the duration of 4-10 h at the temperature that is the maximum allowable for this type of IC; then, coefficient M is found and IC is separated as per its value as to reliability. $$M=\frac{{Е}_{CR}{}_{{}_{BT}}-{Е}_{CR}{}_{{}_{ST}}}{{Е}_{CR}{}_{{}_{BT}}-{Е}_{КР}{}_{{}_{ann}}},$$ where $${Е}_{CR}{}_{{}_{ST}},{Е}_{CR}{}_{{}_{BT}},{Е}_{КР}{}_{{}_{ann}}$$ - values of CSV before BT, after BT and after annealing respectively.

EFFECT: proposed method allows reducing a risk of damage to the tested circuits at the action of external test factors on them.