FIELD: microelectronics.
SUBSTANCE: burn-in testing (BIT) of semi-conductor items (SCI) batch are executed in electric and temperature modes, which are specified in technical conditions and process flowcharts. After SCI extraction from stand, the SCI electric parameters are checked at room temperature, and the check is done for the whole batch not later than 8 hours after items extraction from stand. At that requirements to electric parameters are toughened in relation to norms, which are specified in technical conditions, by 2Δ, where Δ - inaccuracy of measurement.
EFFECT: improves reliability of semi-conductor items.
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