METHOD OF SELECTION OF INTEGRATED PRINTED CIRCUITS FOR RELIABILITY Russian patent published in 2006 - IPC G01R31/26 

FIELD: microelectronics.

SUBSTANCE: method can be used for finding potentially unreliable integrated printed circuits. Noise intensity is measured without power supply at frequency of 1 kHz at direct current and at three temperatures; normal temperature of 25°C, minimal one of 0°C and maximal one of 100°C. Lot of integrated printed circuits is selected to reliable and potentially non-reliable printed circuits on the base of relative change in noise intensity along terminals "input- common point", measured at normal, minimal and maximal temperatures. Reliability and non-reliability of printed circuits is judged from factor of K=([U² _n100°C-U² _n25°C]+ [U² _n25°C-U² _n0°C])/U² _n25°C, where U² _n25°C, U² _n0°C and U² _n100°C are meanings of noise intensity at normal and zero temperatures and 100°C.

EFFECT: simplified process of selection; reduced labor input.

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