FIELD: micro-electronics, namely, methods for determining potentially unreliable integral circuits during production process, and also at inlet control at plants of manufacturers of radio electronic equipment.
SUBSTANCE: on integral circuits, by outputs "power-common point" intensiveness of noise is measured at critical and nominal power voltages. On basis of relatively change of value of noise intensiveness, measured at two power voltages, integral circuits are divided on reliable and potentially unreliable.
EFFECT: increased efficiency.
1 tbl
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD OF SELECTION OF INTEGRATED PRINTED CIRCUITS FOR RELIABILITY | 2005 |
|
RU2284539C1 |
| METHOD FOR DIVIDING ANALOG INTEGRATION CHIPS ON BASIS OF RELIABILITY | 2006 |
|
RU2311653C1 |
| PROCESS OF INSPECTION OF INTEGRATED CIRCUITS FOR DEFECTS | 1998 |
|
RU2143704C1 |
| METHOD OF SEPARATION OF INTEGRATED CIRCUITS | 2005 |
|
RU2278392C1 |
| MODE OF SEPARATION INTEGRAL SCHEMES ACCORDING TO RELIABILITY | 2005 |
|
RU2290652C2 |
| MODE OF SEPARATION OF SEMICONDUCTOR PRODUCTS ACCORDING TO THEIR RELIABILITY | 2005 |
|
RU2292052C1 |
| METHOD FOR RELIABILITY SEPARATION OF SEMICONDUCTOR PRODUCTS | 2005 |
|
RU2309418C2 |
| METHOD FOR DETERMINING POTENTIALLY UNSTABLE DIGITAL INTEGRAL CIRCUITS | 2004 |
|
RU2257591C1 |
| METHOD OF INTEGRATED CIRCUIT DIVISION UPON RELIABILITY CRITERION | 2006 |
|
RU2324194C1 |
| METHOD FOR SELECTING INTEGRATION CIRCUITS OF INCREASED RELIABILITY | 2004 |
|
RU2269790C1 |
