FIELD: the invention provides quality and reliability of semiconductor products as on the production stage, so at application stage.
SUBSTANCE: the essence is in that the intensity of noise 
on two frequencies 1000Hz and 200Hz is measured on a party of semiconductor articles at three different temperatures (0oC, normal and 100oC. The index of the noise spectrum form γ is calculated according to the formula 
Where 
and 
- a square of effective meaning of noise on frequencies F1 and F2 for each product and for each temperature. An average meaning 
is found according to three temperatures for each product and according to the value of the middle meaning of the coefficient the product party is separated on reliable and potentially unreliable.
EFFECT: increases trustworthiness.
2 tbl
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD FOR RELIABILITY SEPARATION OF SEMICONDUCTOR PRODUCTS | 2005 |
|
RU2309418C2 |
| METHOD OF SEMICONDUCTOR ARTICLE CLASSIFICATION BY RELIABILITY | 2010 |
|
RU2515372C2 |
| METHOD OF SORTING SEMICONDUCTOR ARTICLES ACCORDING TO RELIABILITY | 2009 |
|
RU2455655C2 |
| METHOD FOR COMPARATIVE ASSESSMENT OF RELIABILITY OF BATCHES OF SEMICONDUCTOR ARTICLES | 2010 |
|
RU2538032C2 |
| METHOD TO DIVIDE TRANSISTORS BY RELIABILITY | 2010 |
|
RU2507525C2 |
| DEVICE FOR MEASURING PARAMETER OF LOW FREQUENCY NOISE | 2005 |
|
RU2294545C1 |
| METHOD FOR COMPARATIVE ASSESSMENT OF SEMICONDUCTOR RELIABILITY | 2010 |
|
RU2490655C2 |
| METHOD FOR REJECTING SEMICONDUCTOR PRODUCTS WITH REDUCED RELIABILITY LEVEL | 2010 |
|
RU2484489C2 |
| METHOD OF INTEGRATED CIRCUIT DIVISION UPON RELIABILITY CRITERION | 2006 |
|
RU2324194C1 |
| METHOD OF SORTING SEMICONDUCTOR ARTICLES | 2009 |
|
RU2472171C2 |
