FIELD: microelectronics, namely, methods for determining potentially unreliable analog integration microchips in process of production, and also during manufacture of radio-electronic equipment.
SUBSTANCE: on integration chips of operational amplifier type, made using complementary metal-oxide-semiconductor structure technology, coupled according to repeater circuit with grounded non-inverting input, average quadratic voltage of noise is measured on outputs "power to common point" at 1 kHz frequency with frequency band of 200 Hz and averaging time 2s with minimal and maximal value of power voltage matching technical conditions without letting current impulse through. Coefficient 
is determined, where 
- average quadratic noise voltage at maximal and minimal power voltage, respectively. On basis of value coefficient K, integration chips are divided reliability-wise.
EFFECT: increased trustworthiness.
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