FIELD: the proposed invention refers to electro technique namely to the modes of determination of potentially unreliable integral schemes including stableness to electro statistical discharges and may be used at the stage of serial production of integral schemes, and also on entry control at production of radio apparatus.
SUBSTANCE: the proposed mode of separation of integral schemes according to reliability is in measuring meanings of critical voltage of supply before and after influence of electro statistical discharge with permissible magnitude according to technical conditions. At that the integral schemes according to reliability are separated according to the criteria of increasing meaning of critical voltage of supply after one hundred influences with electro statistical discharges in comparison with the initial meaning.
EFFECT: The invention is directed on increase of trustworthiness and expansion of functional possibilities of diagnostic modes.
1 tbl
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| METHOD FOR SCREENING POTENTIALLY UNRELIABLE INTEGRAL CIRCUITS | 2004 |
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