FIELD: microelectronics.
SUBSTANCE: method can be used for selecting highly reliable integral printed circuits from a lot of integral printed circuits. M-characteristics of networks of integral printed circuits are measured within direct current range of 1-10 mA at initial state, then - after they are subject to influence of 5-10 electrostatic discharges (ESD) of positive and negative polarities and then - after thermal annealing during for 4-8 hours. Values of factor of K=mann-mini/mESD-mann, where mann, mini, mESD are maximal values of m-characteristics at initial state, after ESD and after thermal annealing correspondingly. Integral circuits are selected to correspond to two criteria: 1≤m≤A and K≤B, where values A and B are specified on base of statistics at representative sampling for any type-nominal of integral circuits.
EFFECT: high degree of trustworthiness.
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