FIELD: physics.
SUBSTANCE: method of sorting semiconductor articles involves measuring noise intensity before and after external X-ray exposure with dosage of about 10 kR.
EFFECT: faster process of sorting semiconductor articles according to potential reliability.
1 tbl
| Title | Year | Author | Number |
|---|---|---|---|
| METHOD OF SEMICONDUCTOR ARTICLE CLASSIFICATION BY RELIABILITY | 2010 |
|
RU2515372C2 |
| METHOD TO DIVIDE TRANSISTORS BY RELIABILITY | 2010 |
|
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RU2455655C2 |
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RU2375719C1 |
| PROCEDURE OF SELECTION OF ELECTRON ARTICLES BY STABILITY AND RELIABILITY | 1999 |
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RU2168735C2 |
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| METHOD OF INCREASING RELIABILITY OF BATCHES OF SEMI-CONDUCTOR ITEMS | 2006 |
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| METHOD OF COMPARATIVE TEST FOR RELIABILITY OF BATCHES OF INTEGRATED CIRCUITS | 2012 |
|
RU2546998C2 |
| METHOD FOR SELECTING PLATES WITH RADIATION-RESISTANT MOS INTEGRATED CIRCUITS | 1995 |
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RU2082178C1 |
| METHOD OF DETERMINING RESISTANCE TO RADIATION AND TEMPERATURE EFFECTS OF NANOELECTRONIC RESONANT-TUNNELING DIODE (RTD) BASED ON MULTILAYER ALGAAS (ALUMINIUM, GALLIUM, ARSENICUM) SEMICONDUCTOR HETEROSTRUCTURES | 2015 |
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RU2606174C1 |
