METHOD AND DEVICE FOR SCATTERING MATRIX MEASURING (VERSIONS) Russian patent published in 2008 - IPC G01R29/08 G01S13/04 

Abstract RU 2331896 C1

FIELD: electricity.

SUBSTANCE: method and device for scattering matrix measuring provides for item placing in free space and far-out zone of two or three antennae. Initially, item of measuring is exposed to the first antenna. Reemissions are accepted at the same polarising level and amplitude and phase are measured. Monochrome emission of reference signal generator is accepted by the second antenna. Generator is mounted on measuring item surface so that radiator is placed in the point of item rotation axis passing through the surface. Frequency of reference signal emission is a multiple of the first antenna emission or presents a fraction which is multiple of reciprocal value of integer. Frequency of accepted signal is transformed into the first antennae emission frequency, and phase of measuring item re-emission components is measured with regard to transformed frequency phase of reference signal. After that, the first antenna polarisiation is changed to the other orthogonal component of emission for the selected polarising basis and measuring is repeated. The third antenna accepts, measures and records measuring item re-emission component, which is orthogonal to the first antenna emission.

EFFECT: measuring of full scattering matrix elements.

6 cl, 4 dwg

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RU 2 331 896 C1

Authors

Valeev Georgij Galiullovich

Dates

2008-08-20Published

2006-10-30Filed