ETCHING METHOD AND ETCHING SYSTEM Russian patent published in 2008 - IPC H01L21/3065 

Abstract RU 2332749 C1

FIELD: physics; electricity.

SUBSTANCE: etching system contains plasma-generating facilities for plasma generating in vacuum chamber, high-frequency displacement voltage source, supplying high-frequency displacement voltage to electrode-substrate, floating electrode opposite to electrode-substrate in vacuum chamber and supported in floating condition by electric potential, solid material placed on the side of the floating electrode directed to electrode-substrate to form film layer protecting from etching, and control unit for periodic supply of high-frequency voltage to floating electrode. Etching method includes repetition, in specified sequence, of substrate etching stage by means of etching gas supplied to vacuum chamber, and film layer formation stage protecting substrate from etching by sputtering of solid material opposite to substrate.

EFFECT: high etching selectivity when using mask as well as production of anisotropic profile and great etching depth.

22 cl, 7 dwg

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RU 2 332 749 C1

Authors

Morikava Jasukhiro

Khajasi Tosio

Suu Koukou

Dates

2008-08-27Published

2005-06-23Filed