METHOD FOR ANALYSIS OF FRICTION WITH APPLICATION OF ATOMIC-FORCE MICROSCOPY AND DEVICE FOR ITS REALISATION Russian patent published in 2009 - IPC G01N13/16 

FIELD: physics, measurements.

SUBSTANCE: method for analysis of friction with application of atomic-force microscopy and device for its realisation may be used for investigation of tribological properties of surfaces in nanometre scale. Device for analysis of friction with application of atomic-force microscopy comprises sample holder, in which sample is installed, laser radiator and photodetector, micrometre beam, one end of which is rigidly fixed in holder of micrometre beam, and the other free-hanging end, in which probe is fixed. Holder of micrometre beam is connected to vibrating element, and is also joined with unit for execution of mutual displacement of probe and sample in any of horizontal directions. Besides unit for execution of mutual displacement of probe and sample in any of horizontal directions is connected between sample holder and metering angle, and metering angle is connected via unit that controls value of sample and probe approaching in vertical direction with sample holder. Moreover, the following components are additionally installed in it -amplifier of signal from photodetector and visualisation unit, besides, amplifier of signal from photodetector is connected between photodetector and metering unit, and unit of visualisation is also connected with metering angle, besides, photodetector is made of four sections and is installed in space so that identical amount of laser radiation is supplied in it. Method is realised with above mentioned device.

EFFECT: provision of simplified highly accurate measurement of dissipation for friction between two touching bodies, in wide range of speeds and in any local point of their contact.

5 cl, 7 dwg