FIELD: instrument making.
SUBSTANCE: invention relates to measuring techniques, more specifically to scanning probe microscopes with atomic resolution. The scanning probe microscope includes a probe holder with a probe, mounted on a piezo scanner, made in form of a piezo tube with X, Y and Z electrodes and mounted on a base, a sample holder with a sample, mounted on a block for bringing the sample closer to the probe, mounted on a base, and a control unit with a feedback module, connected to the piezo scanner, probe and the block for bringing the sample closer to the probe. The scanning probe microscope also contains a probe carrier, which can be mounted on the probe holder. The block for bringing the sample closer to the probe is made in form of a piezo packet with a guide, on which is mounted a carrier with a sample holder. The piezo packet is attached to the base and, together with the guide, carrier and sample holder, lies inside the piezo tube.
EFFECT: meant for teaching untrained users.
13 cl, 3 dwg
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