FIELD: physics.
SUBSTANCE: invention relates to growing doped germanium monocrystals in a temperature gradient using a heating element immersed in a melt under conditions of an axial heat flow near a crystallisation front (OTF method). The doped germanium monocrystals are grown from a melt in a crucible placed on a heat-removing unit to an crystallographically directed innculant with diametre equal to the inner diametre of the crucible, under conditions of axial heat flow near the crystallisation front - OTF method, using a multi-section background heater and a multi-section immersed in the melt - OTF-heater kept at constant temperature T1 by moving the crucible with the inoculant and growing crystal into the cold zone of the furnace relative the OTF-heater, with different initial concentrations of doping impurities C1 in the crystallisation zone W1 with height of the melt h, and C2 in a replenishment zone W2, and with reduction of temperature of the bottom of the crucible T4(t) when moving, in accordance with the law: T4(t)=T4 0 -a×t, where T4 0 is initial temperature value, a=v(λm×gradTp+Q)/λcr, v is drawing rate of the crystal, λm is thermal conductivity of molten germanium, gradTp is axial temperature gradient in the melt in which the crystal is grown, Q is crystallisation heat, λcr is thermal conductivity of the germanium crystal. Mass transfer of the melt is controlled in the crystallisation zone by selecting optimum ratio between axial temperature gradient in the melt gradTp, radial distribution of temperature along the OTF-heater, height of the layer of the melt h and drawing rate v. Germanium monocrystals are grown in crystallographic dirctions [111] and [100] depending on diametre of the crystal and required quality given the following parameters: h=5-30 mm, gradTp=3-50°C/cm, v=2-30 mm/h, temperature difference of the OTF-heater T2-T1=0-6°C, temperature difference between the lateral surface of the crucible T3 and temperature of the OTF-heater T2, equal to T3-T2=1-20°C.
EFFECT: obtaining germanium monocrystals with diametre of up to 150 mm without growth region with high cross sectional macro-uniformity of distribution of resistance of 5-10%.
10 cl, 1 ex, 2 dwg
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Authors
Dates
2010-02-10—Published
2008-05-15—Filed