METHOD OF PROBE ADAPTATION FOR CHEMICAL FORCE MICROSCOPY Russian patent published in 2010 - IPC G01Q60/38 

FIELD: measuring technology.

SUBSTANCE: invention refers to chemical force microscopy (CFM) and can be used for intensification of chemical contrast of the images formed by means of a nuclear force microscope ensured by physical and chemical adaptation of the probing needles. The method of probe adaptation for chemical force microscopy consists that a probe placed in a reactor, processed wit ha low-temperature plasma of inorganic (e.g. residual air, nitrogen) gases or organic (e.g. octane) gases. Said plasma is excited with a variable electromagnetic field of high-frequency range (10 MHz - 100 MHz) mainly or with direct current of variable polarity. Thus a uniform plasma-polymerised coating is formed over the whole surface of the probe.

EFFECT: development of the simple and effective method for adaptation of the chemical surface structure of needles of standard probes for nuclear force microscopy.

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