FIELD: instrument making.
SUBSTANCE: essence of the invention consists in manufacturing method of a colloidal probe, in which an atomic-force microscope (AFM) is used, and its own serviceable probe. First, using AFM, visualisation of colloidal particles pre-deposited on a smooth substrate is performed, and as per the principle of minimum number of neighbours a candidate for fixation is chosen among them. Then, using AFM, the particle is fixed on a probe needle tip. Operations are completed with immediate acknowledgment using AFM that the chosen particle is fixed.
EFFECT: increasing repeatability and manufacturing reliability of a colloidal probe, especially when colloidal particles of submicron sizes are used.
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