X-RAY ANALYSER Russian patent published in 2010 - IPC G01T1/00 

FIELD: measurement technique.

SUBSTANCE: invention refers to recording X-ray and gamma emissions, to determination of their energy spectrum, to medical tomography, to nondestructive control of materials and products by radio- and tomography methods, to detection of ionisation radiation sources, to monitoring luggage contents at checkpoints. In X-ray analyser, scintillator layer is located along direction of radiation propagation, is opaque in perpendicular direction and base is made as cellular structure.

EFFECT: analysis of X-ray radiation spectrum with spatial resolution not worse than 1 mm, possibility to integrate single spectrum analysers into one-axis linear detectors, possibility to create integrated assemblies of one-axis linear detectors of various lengths for purposes of medical and industrial radiography and tomography.

11 cl, 4 dwg