AUTOMATED MEASUREMENT SYSTEM Russian patent published in 2010 - IPC G05B13/00 

FIELD: physics.

SUBSTANCE: system has controlled sources of test effects, information-bearing parametre measuring devices, devices for measuring parametres of non-controlled external effects and a control computer. Metrological characteristics are evaluated by connecting outputs of corresponding sources of stimulating effects through connection cables to inputs of the information-bearing parametre measuring devices. If necessary, the connectors include matching links and have time-stable transient characteristics which prevent additional errors for evaluating integrity of metrological characteristics of the measurement system. Metrological characteristics are then measured and evaluated using a program for automatic inspection of integrity of metrological characteristics, where the said program is installed on the control computer.

EFFECT: increased reliability due to longer intervals between inspections of the measurement system and provision for the given level of metrological characteristics of the measurement system during the interval between inspections.

2 cl, 1 dwg