METHOD OF TESTING STORABILITY OF INFRARED MULTI-ELEMENT PHOTODETECTOR Russian patent published in 2010 - IPC H01L21/66 G01R31/26 

FIELD: physics.

SUBSTANCE: device has adhesive joints in an evacuated chamber with operating temperature of photosensitive elements lower than ambient temperature and is designed for detecting infrared radiation. In order to carry out tests, the number of storage cycles is given, including holding the switched off device for a given period of time. Duration of one cycle (t_cycle) is given as a sum of the first (t₁) and second (t₂) time intervals. During the time interval t₁, the device is held at a first temperature (T₁) value. In time interval t₂, the device is held under thermal cycling conditions between second (T₂) and third (T₃) temperature values. T₁ and T₂ exceed the given ambient temperature (T₀) and but do not exceed high operating temperature of the medium (T_{high op}). T₃ is not lower than the lower operating temperature of the low temperature of the medium (T_{high op}). The evacuated chamber undergoes gettering. Heat leakage of the switched on device or its time for entering the mode and at least one photoelectric parametre are measured under normal climatic conditions.

EFFECT: cutting on time for testing a multi-element photodetector.

5 dwg