METHOD OF MEASURING ABSOLUTE SPECTRAL SENSITIVITY OF IR MPDD Russian patent published in 2019 - IPC G01J3/00 

FIELD: measurement technology.

SUBSTANCE: invention relates to methods of measuring absolute spectral sensitivity of multielement or matrix infrared photodetectors (IR MPDD). Said technical result is achieved by the fact that N measurements of integral signals of the photosensitive elements (PSE) of the IR MPDD are performed at different stationary temperatures of the black body model (BBM). BBM has small size of radiating platform, its radiation is modulated and K measurements of integral signal at each stationary temperature of BBM are measured. Thus, for each PSE a data array is accumulated, including K⋅N measurements. Then, for each BBM fixed temperature, the mean-square deviation from the average PSE signal value is automatically calculated, which will be equal to the value of the light modulated signal from the BBM radiation. Obtained signal value is automatically substituted into the left part of integral equations, including convolution of Planck function and corresponding photoelectric characteristic: current S_I(λ),volt S_u(λ) sensitivity or quantum efficiency η(λ). By converting integral equations, three systems of linear equations for which unknowns will be spectral components of said characteristics are obtained for each PSE. Solving systems, obtained dependencies S_I(λ), S_u(λ) and η(λ).

EFFECT: method enables one-dimensional determination of absolute spectral sensitivity of all photosensitive elements of the IR MPDD.

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