FIELD: physics.
SUBSTANCE: when realising said method, a controlled parallel beam of surface electromagnetic waves (SEW) is excited on the plane surface of a sample using incident monochromatic radiation. The SEW field intensity is measured. The controlled SEW parallel beam is split into two parallel beams and intensity of the obtained beams is measured after traversing different distances x1 and x2 on non-coincident paths. The attenuation coefficient is then calculated using the formula: 
, where I1 and I2 are values of intensity of the beams after traversing distances x1 and x2, where x2>x1.
EFFECT: higher measurement accuracy and possibility of visual monitoring of the analysed surface and free access to the surface during measurement.
1 dwg
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