FIELD: physics.
SUBSTANCE: invention relates to the field of the materials surface study by optical methods, and concerns the infrared range surface electromagnetic wave (SEW) attenuation coefficient during the single radiation pulse determination device. Device includes the collimated p-polarized monochromatic radiation source, the source radiation into the SEW beam conversion element, having the flat face sample, and capable of the SEW directing, element for the original semiconductor beam division into two secondary beams, two focusing lenses and two photodetectors placed in these lenses foci, and coupled with the measuring instruments. SEW beam division element is made in the form of the flat beam-splitting plate with the given SEW known reflection and transmission coefficients, oriented perpendicular to the sample edge, adjacent to it and intersecting the original SEW beam.
EFFECT: technical result consists in increase in the measurement procedure accuracy and its simplification.
1 cl, 1 dwg
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Authors
Dates
2019-03-12—Published
2018-03-14—Filed