SCANNING PROBE MICROSCOPE FOR OPTICAL SPECTROMETRY Russian patent published in 2017 - IPC G01Q60/00 

Abstract RU 2616854 C2

FIELD: physics.

SUBSTANCE: microscope includes a base 1, a measuring head 2, a probe sensor 3, a probe sensor holder 4, a scanning base 5 with the sample holder 6, the first lens 7 and the first imaging system 9 optically conjugated with the first lens 7 and the sample 10. Also the first input/output radiation system 8 situated at the measuring head side 2 relative to the device base 1, the confocal microscope 11 optically conjugated with, at least, one radiation source 12 and the first input/output radiation system 8, a spectrometer 13 comprising, at least, one detector 14 and optically conjugated with the first input/output radiation system 8, are introduced in the microscope. The probe sensor 3 is optically exposed for access of the radiation source 12, optically conjugated by the first lens 7 with the first input/output radiation system 8 and comprises an optically active zone 15.

EFFECT: increasing the design flexibility, enhancing fluorescence, Raman scattering, increasing the spatial resolution of the optical spectroscopy.

23 cl, 3 dwg

Similar patents RU2616854C2

Title Year Author Number
TWO-COORDINATE MICRO-POSITIONER 2006
  • Zhizhimontov Vladimir Vadimovich
  • Beljaev Aleksej Vladimirovich
  • Saunin Sergej Alekseevich
RU2306621C1
SCANNING PROBE MICROSCOPE WITH MULTIZONDE SENSOR OPERATION DEVICE 2017
  • Bykov Andrej Viktorovich
  • Kotov Vladimir Valerevich
  • Polyakov Vyacheslav Viktorovich
  • Kuznetsov Evgenij Vladimirovich
  • Prilepskaya Lyudmila Petrovna
RU2695517C2
SCANNING PROBE MICROSCOPE FOR BIOLOGICAL APPLICATIONS 2008
  • Bykov Andrej Viktorovich
  • Bykov Viktor Aleksandrovich
  • Rjabokon' Valerij Nikolaevich
RU2472165C2
SCANNING PROBING MICROSCOPE WITH COMPACT SCANNER 2012
  • Fan Ngi
  • Markakis Dzheff
  • Kindt Jokhannes
  • Masser Karl
RU2571449C2
PROBE FOR SCANNING PROBE MICROSCOPY AND METHOD OF ITS MANUFACTURING (EMBODIMENTS) 2017
  • Sinev Ivan Sergeevich
  • Mukhin Ivan Sergeevich
  • Samusev Anton Kirillovich
  • Makarov Sergej Vladimirovich
  • Komissarenko Filipp Eduardovich
RU2660418C1
SCANNING SOUNDING MICROSCOPE 1997
  • Bykov V.A.
RU2152063C1
DEVICE OF MECHANICAL DISPLACEMENT FOR SCANNING PROBE MICROSCOPE 2015
  • Bykov Andrej Viktorovich
  • Vinogradov Dmitrij Ivanovich
  • Kuznetsov Evgenij Vladimirovich
  • Timofeev Sergej Vladimirovich
  • Shelaev Artem Viktorovich
RU2629538C2
NANOTECHNOLOGICAL COMPLEX 2010
  • Bykov Viktor Aleksandrovich
  • Bykov Andrej Viktorovich
  • Kotov Vladimir Valer'Evich
RU2522776C2
SCANNING PROBE MICROSCOPE WITH MULTIPLE-PROBE SENSOR OPERATING DEVICE 2013
  • Bykov Viktor Aleksandrovich
  • Bykov Andrej Viktorovich
RU2538412C1
SCANNING PROBE MICROSCOPE WITH CONTROLLED MEASUREMENT MEDIUM 2008
  • Bykov Viktor Aleksandrovich
  • Bykov Andrej Viktorovich
  • Kotov Vladimir Valer'Evich
RU2401983C2

RU 2 616 854 C2

Authors

Bykov Andrej Viktorovich

Kuznetsov Evgenij Vladimirovich

Timofeev Sergej Vladimirovich

Fastov Sergej Anatolevich

Shelaev Artem Viktorovich

Dates

2017-04-18Published

2015-09-30Filed