FIELD: nanotechnology.
SUBSTANCE: scanning probe microscope comprises a platform with a unit of preliminary approach, piezoscanner on which the crystal resonator is mounted, which is located with the ability of interaction with the probe. The crystal resonator comprises two levers of different lengths and is located at an angle not equal to 90 degrees to the sample surface, and the probe is fixed on the long lever.
EFFECT: increased reliability of the device and durability of the probes, expanding its functional capabilities.
9 dwg
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|---|---|---|---|
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