FIELD: machine building.
SUBSTANCE: cantilever for scanning probing microscope (SPM) consists of base whereto there is attached two-layer beam with needle located on remote from base end. The beam is made of composite material; also, one of layers is made of active thermo-sensitive or magnet-sensitive material with shape memory effect (SME) sensitive to external action, while another layer is elastic.
EFFECT: raised efficiency of SPM due to reduced overhead time losses at investigations.
1 dwg
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