MULTI-PROBE CONTOUR-TYPE SENSOR FOR SCANNING PROBING MICROSCOPE Russian patent published in 2005 - IPC

Abstract RU 2244256 C1

FIELD: microscopy.

SUBSTANCE: device has base, on which cantilevers are fixed with probes at ends, platform is inserted, base is made in form of flat body, on which along contour cantilevers are placed with probes at ends, and angles between longitudinal cantilevers axes are different from 0° and have positive values, while base is connected to platform with possible rotation and fixing relatively to it.

EFFECT: simplified maintenance, broader functional capabilities.

10 cl, 6 dwg

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RU 2 244 256 C1

Authors

Alekseev M.E.

Bykov V.A.

Saunin S.A.

Dates

2005-01-10Published

2003-06-05Filed