FIELD: electricity.
SUBSTANCE: invention refers to energy analysis of flows of charged particles charged with X-ray radiation from solid body surface and can be used for improvement of analytical, operating and consumer properties of electronic spectrometres used for investigation of objects of micro- and nanoelectronics by methods of X-ray-and-electronic spectroscopy. Method is implemented by using three-stage electrostatic energy analyser of charged particles, which provides for angular focusing of the second order of "axis-ring" type and range of entrance angles, within which photoelectrons 60°±2° are analysed, which allows coaxially building of X-ray source into analyser; at that, almost at minimum possible distance from sample.
EFFECT: improving the main operating parameter of analyser, sensitivity with simultaneous simplification of layout of spectrometer as a whole.
1 dwg
| Title | Year | Author | Number | 
|---|---|---|---|
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 | RU2448389C2 | 
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| CHARGED PARTICLE ENERGY ANALYZER | 0 | 
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| ISO-TRAJECTORY MASS SPECTROMETER | 2011 | 
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| ANALYZER OF ENERGIES OF CHARGED PARTICLES | 2005 | 
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 | SU1150680A1 | 
| ELECTROSTATIC AXIALLY SYMMETRIC ENERGY ANALYSER | 0 | 
 | SU1112440A1 | 
| DEVICE FOR ANALYSING PERFECTION OF STRUCTURE OF CRYSTALLINE LAYERS | 2007 | 
 | RU2370758C2 | 
| CHARGED-PARTICLE SPECTROMETER | 1994 | 
 | RU2076387C1 | 
Authors
Dates
2011-08-20—Published
2009-11-25—Filed