FIELD: physics.
SUBSTANCE: in the lead frame for a SHF and EHF semiconductor device, consisting of several leads outer and inner ends, the thickness of the lead frame is equal to 1-30 mcm and the length of outer leads which come out of the semiconductor device chip is equal to 0.1-1.5 mm, points for connecting inner and outer ends of the leads, as well as crossing the sections of the leads are smooth. At least two flat leads have a tapered section, wherein the width of its narrow part WH coincides with the size of the inner end, and the width of the wide part Wk and length l satisfy the condition: ΔL/ΔC=1.15±0.75, where: ΔL is the relative change in spurious inductance of the flat lead L in percentages to its maximum possible change when Wk changes from 0.03 to 1 mm; ΔC is the relative change in spurious capacitance of the flat lead C in percentages to its maximum possible change when Wk changes from 0.03 to 1 mm, wherein L=0.05+[0.66-0.04(Wk/WH)]1, C=[0.008+0.0002fWk/WH)]1, WH is greater than or equal to 0.03 mm, and Wk varies from 0.04 to 1 mm.
EFFECT: improved electrical characteristics owing to optimisation of the configuration of leads and reduced power loss of the SHF signal.
2 cl, 5 dwg
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Authors
Dates
2012-07-20—Published
2011-03-16—Filed