FIELD: physics.
SUBSTANCE: proposed method consists in using matrix of probes including light reflector rigidly secured thereto and arranged in cartridge with multiple parallel guides located at nodes of 2D grid with known coordinates Xi,Yi of contact points of every probe relative to cartridge center to allow free displacement of every probe in axis Z perpendicular to measured surface. Aforesaid matrix is precalibrated in height by measuring coordinates Zi of every probe when all probes stay in contact with smooth flat reference surface, normal to which being aligned with Z direction. In relative displacement of initial 3D object and cartridge with probe matrix in XY plane, measured are coordinates Xo,Yo of cartridge center and coordinates Zoi of every probe in position of contact of all probes with said object. Shapes of the surface are calculated proceeding from difference of said coordinates Xo-Xi, Yo-Yi, Zoi-Zi to repeat calculations, if required.
EFFECT: possibility to measure shape of dynamic object shape, higher accuracy.
3 cl, 2 dwg
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Authors
Dates
2013-01-10—Published
2011-08-23—Filed