PHOTOSENSITIVE STRUCTURE AND SELECTIVE PHOTODETECTOR BASED THEREON Russian patent published in 2014 - IPC H01L31/101 B82B1/00 

Abstract RU 2510101 C2

FIELD: physics.

SUBSTANCE: in a photosensitive structure, which is a multilayer semiconductor heterostructure which is sensitive to terahertz radiation at effective photocurrent temperature, said heterostructure having a quantum well in form of a layer of a narrow-bandgap solid solution containing Hg and Te and enclosed between barrier layers of a wide-bandgap three-component solid solution of CdyHg1-yTe, where y is a value preferably in the range from 65% to 72%, the narrow-bandgap quantum well is formed from a three-component solid solution of Hg1-xCdxTe with content of Cd defined by a value x in the range from 4% to 12%, wherein the width of the quantum well is selected for the given terahertz frequency subrange of the received radiation at temperature of 4.2 K or 77 K depending on content of Cd in accordance with table 1 given in the claim. When the disclosed photosensitive structure is made as a desired terahertz photodetector - selective photodetector, in the latter, having a terahertz radiation sensitive photodetector line, which is in form of saeries-arranged areas of a multilayer semiconductor heterostructure having effective photosensitivity in different terahertz subranges at temperature of 4.2 K or 77 K, said areas having a working detector layer on a quantum well formed from a narrow-bandgap three-component solid solution of Hg1.xCdxTe and enclosed between barrier layers of a wide-bandgap three-component solid solution of CdyHg1-yTe, where y is a value preferably in the range from 65% to 72%, and a means of maintaining said temperature, for areas of the multilayer semiconductor heterostructure with selected terahertz frequency subranges of the received radiation, given by the following intervals of energy values of the received radiation ħω: 8-16, 16-24, 24-32, 32-40, 40-48, 48-56, 56-64 meV, the width of the quantum well is equal to 11 nm with content of Cd in the working detector layer on the quantum well - Hg1-xCdxTe on series-distributed areas of the photodetector line in accordance with said terahertz frequency subranges of the received radiation at temperature of 4.2 K, defined by the following intervals of values x, respectively: 7.1-7.9, 7.9-8.7,8.7-9.4,9.4-10.1, 10.1-10.9, 10.9-11.5, 11.5-12.2%, or at temperature of 77 K, defined by the following intervals of values x, respectively: 5-5.9, 5.9-6.7, 6.7-7.5, 7.5-8.3, 8.3-9.0, 9.0-9.8, 9.8-10.5%.

EFFECT: invention improves manufacturability of desired terahertz photodetectors by creating structural conditions for operation of the photodetector element on the level of stable high sensitivity in different subranges in a wide frequency range of the terahertz received radiation depending on the width of the quantum well.

3 cl, 2 tbl, 2 dwg

Similar patents RU2510101C2

Title Year Author Number
INFRARED PHOTOSENSITIVE STRUCTURE AND METHOD OF MAKING SAME 2013
  • Vojtsekhovskij Aleksandr Vasil'Evich
  • Nesmelov Sergej Nikolaevich
  • Dzjadukh Stanislav Mikhajlovich
  • Sidorov Jurij Georgievich
  • Dvoretskij Sergej Alekseevich
  • Mikhajlov Nikolaj Nikolaevich
  • Varavin Vasilij Semenovich
  • Jakushev Maksim Vital'Evich
  • Vasil'Ev Vladimir Vasil'Evich
RU2529457C1
INFRARED RADIATION SENSITIVE STRUCTURE AND METHOD OF MAKING SAID STRUCTURE 2009
  • Vojtsekhovskij Aleksandr Vasil'Evich
  • Nesmelov Sergej Nikolaevich
  • Dzjadukh Stanislav Mikhajlovich
  • Sidorov Jurij Georgievich
  • Dvoretskij Sergej Alekseevich
  • Mikhajlov Nikolaj Nikolaevich
  • Varavin Vasilij Semenovich
  • Jakushev Maksim Vital'Evich
  • Vasil'Ev Vladimir Vasil'Evich
RU2396635C1
STRUCTURE PHOTOSENSITIVE TO INFRARED RADIATION AND METHOD FOR ITS MANUFACTURE 2021
  • Voitsekhovskii Aleksandr Vasilevich
  • Gorn Dmitrii Igorevich
  • Nesmelov Sergei Nikolaevich
  • Dziadukh Stanislav Mikhailovich
  • Mikhailov Nikolai Nikolaevich
  • Dvoretskii Sergei Alekseevich
  • Sidorov Georgii Iurevich
RU2769232C1
METHOD OF PROFILING COMPOSITION AT EPITAXIAL FORMATION OF SEMICONDUCTOR STRUCTURE BASED ON SOLID SOLUTIONS 2019
  • Shvets Vasilij Aleksandrovich
  • Mikhajlov Nikolaj Nikolaevich
  • Dvoretskij Sergej Alekseevich
  • Ikusov Danil Gennadevich
  • Uzhakov Ivan Nikolaevich
RU2717359C1
EMITTING HETEROSTRUCTURE HAVING INTERNAL INJECTION AMPLIFICATION 2012
  • Bekirev Uvenalij Afanas'Evich
  • Potapov Boris Gennad'Evich
RU2576345C2
FREQUENCY-TUNED FAR-INFRARED AND TERAHERTZ COHERENT SOURCE ON SEMICONDUCTOR NANOHETEROSTRUCTURE 2011
  • Kukushkin Vladimir Alekseevich
RU2478243C1
METHOD OF DETECTING ELECTROMAGNETIC RADIATION AND DEVICE FOR REALISING SAID METHOD 2012
  • Arapkina Larisa Viktorovna
  • Storozhevykh Mikhail Sergeevich
  • Chizh Kirill Vsevolodovich
  • Chapnin Valerij Alekseevich
  • Jur'Ev Vladimir Arturovich
RU2503090C1
MULTICHIP POLYCHROMATIC PHOTO RECEIVER (PR) WITH EXPANDED SPECTRAL RESPONSE OF QUANTUM EFFICIENCY 2014
  • Jakovleva Natal'Ja Ivanovna
  • Boltar' Konstantin Olegovich
  • Nikonov Anton Viktorovich
RU2564813C1
SUPERCONDUCTING SEMICONDUCTOR NANOSTRUCTURE WITH QUANTUM WELLS 2002
  • Kadushkin V.I.
RU2227346C1
SUPERCONDUCTING TUNNEL DIODE 1988
  • Tager A.S.
  • Belousov P.S.
  • Gusel'Nikov N.A.
  • Snegirev V.P.
SU1575858A1

RU 2 510 101 C2

Authors

Spirin Kirill Evgen'Evich

Zholudev Maksim Sergeevich

Gavrilenko Vladimir Izjaslavovich

Dates

2014-03-20Published

2012-06-07Filed