FIELD: nanotechnology.
SUBSTANCE: invention can be used for research of samples, such as biomaterials and medical products, by methods of scanning probe microscopy, including the study of the internal pores by the probe of a scanning probe microscope (SPM). To study the three-dimensional structures the cut of sample of three-dimensional structure is performed with a knife, and the study of the cut surfaces with a probe with a SPM sensor element, then the internal areas of the three-dimensional structure are studied. Then, according to the results of this study, an additional cut of three-dimensional structure is carried out, and additional study of the surface of the three-dimensional structure and its internal areas with a SPM sensor probe is carried out.
EFFECT: increase of informativeness of the study of three-dimensional structures.
6 cl, 7 dwg
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