FIELD: chemistry.
SUBSTANCE: invention can be used for non-contact and remote determination of thickness of flat dielectric materials. Invention comprises simultaneously emitting electromagnetic waves of a frequency F1 and a frequency k times higher kF1 towards surface of dielectric plate normal to it, receiving reflected wave, phase difference is calculated φ1 between received wave with frequency kF1 and a wave with a frequency F1, pre-multiplied by k, then simultaneously emitting electromagnetic waves with different frequency F2 and a frequency k times higher kF2 towards surface of dielectric plate normal to it, receiving reflected wave, phase difference is calculated φ2 between received wave with frequency kF2 and a wave with a frequency F2, pre-multiplied by k, thickness of dielectric plate is determined by phases φ1 and φ2.
EFFECT: technical result is increasing accuracy of measurement.
1 cl, 1 dwg
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