FIELD: measuring equipment.
SUBSTANCE: invention relates to optical measurements and can be used for complete polarisation state determination of light reflected from surface of analysed sample. To determine Muller matrix, analysed sample is illuminated with polarised light beam and measuring change in polarization using separation of reflected beam on p- and s-component with decomposition of amplitude and phase to obtain at outlet of four light beams with intensities IΨ1, IΨ2, IΔ1, IΔ2, wherein azimuth angles of optical elements receiving fixed values in certain combinations, polariser is fixed in positions P = 0°, -45°, +45°, analyzer in amplitude channel AΨ= 0°, 45°, phase channel AΔ= 45°, Fresnel rhombus R = 0 and measurements corresponding to following configurations: A: P45SR0WΨ45WΔ45; B: P45SR0WΨ0WΔ45; F: P0SR0WΨ45WΔ45; E: P0SR0WΨ0WΔ45. Change state of polarisation of incident light on specimen with linear on circular, each optical channel before sample retarder in position D = 0° and measurements corresponding configurations C: P-45D0SR0WΨ0WΔ45; D: P-45D0SR0WΨ45WΔ45, while components of Muller matrix Sij is determined by solving system of linear equations.
EFFECT: invention enables complete determining polarisation state of light reflected from surface of analysed sample, for location of all components of Muller matrix.
1 cl, 1 dwg
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Authors
Dates
2016-05-10—Published
2015-03-24—Filed