DEVICE FOR HIGH-RESOLUTION MAPPING AND ANALYSIS OF ELEMENTS IN SOLIDS Russian patent published in 2016 - IPC G01N21/71 

Abstract RU 2584375 C2

FIELD: physics.

SUBSTANCE: invention can be used for elemental analysis, and is applicable in aeronautics and nuclear industries. Device (1) for display and analysis of at least one element of interest contained in a solid sample (10) by optical emission spectrometry on laser-induced plasma enables a high resolution display of elements, mainly, such as hydrogen and oxygen.

EFFECT: device allows for a high resolution display of elements, requires costly installations.

12 cl, 7 dwg

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RU 2 584 375 C2

Authors

Lakur Zhan-Ljuk

Karon Nadezh

Beranzhe Kevin

Dates

2016-05-20Published

2011-09-06Filed