FIELD: physics.
SUBSTANCE: invention can be used for bench acoustic-emission measurements at cryogenic temperatures. Invention consists in that method for bench acoustic-emission measurements on samples of materials at cryogenic temperatures involves tests by using a special device - cryothermostat, which is assembled directly on sample for testing, installation of piezoelectric transducers of acoustic emission via waveguides outside of sample and gap of sample with detection of acoustic emission signals.
EFFECT: technical result is possibility of maintaining specified parameters of cryogenic temperature of samples for bench acoustic-emission measurements when piezoelectric transducers are placed directly on sample.
1 cl, 3 dwg
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