X-RAY ANALYZER Russian patent published in 2017 - IPC G01N23/223 

FIELD: physics, measurement equipment.

SUBSTANCE: application for X-ray analysis of heavy elements. The invention invloves the X-ray analyzer comprising a source of X-ray or gamma radiation, a sample holder, a detection device with multiple detectors, recording equipment, with inputs connected to the detectord outputs, a primary beam collimator, a secondary beam collimator and filter, wherein the sample holder is configured to install the sample with a flat or concave working surface on a sphere, its source or focus is located at the said sphere, the secondary beam collimator comprises transverse baffles with holes, its outlet is located in the point opposite to the source, and the detectors are arranged compactly in the secondary beam.

EFFECT: invention provides simplification of the secondary beam collimator, ensuring sample homogeneity, and lowering the threshold of detection of rare and heavier elements.

2 cl, 2 dwg