FIELD: measuring equipment.
SUBSTANCE: invention relates to measuring technology and relates to a method for determining the sign of circular polarization of light. Sign of circular polarization of light is determined by the action of light on a photoresistive element equipped with two electrodes, sensitive to changing the sign of circular polarization, measuring the electrical resistance between the electrodes and determining the sign of circular polarization of light by the match of the value of the measured resistance with the value of the previously calibrated resistance between the electrodes of the same photoresistive element. As a photoresist element, MIS nanostructure consisting of a CoPt-based metal layer, Al-based dielectric layer based on Al2O3 and/or SiO2 and a semiconductor layer based on InGaAs/GaAs heterostructure formed on a non-conducting substrate.
EFFECT: technical result consists in ensuring that the sensitivity of an optically active element can be adjusted to a change in the sign of polarization.
2 cl, 3 dwg
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Authors
Dates
2018-07-23—Published
2017-09-05—Filed