FIELD: physics.
SUBSTANCE: invention relates to a method for obtaining a sample image. Method of measuring sample (3) contains the steps: (I) providing light of the first composition; (II) selecting a particle from a group of particles that are induced to emit photons under the influence of light of the first composition; (III) forming the light of the first composition to provide a light intensity distribution comprising a spatially limited minimum; (IV) applying the distribution of the light intensity to the sample so that the particle is localized in a spatially limited minimum of the light intensity distribution; (V) detecting photons emitted by a particle; and tracking the movement of the particle by minimizing light intensity distribution by (VI) moving the light intensity distribution relative to the sample so that the velocity of the photon emitted by the particle remains minimal, and (VII) obtaining the actual position of the light intensity distribution minimum in the sample as the actual position of the particle in the sample. To obtain a sample image, the method comprises additional steps: (VIII) determining the residence time of the particle for each of the plurality of sample portions and (IX) displaying residence time distribution in the sample.
EFFECT: method of producing a sample image is proposed.
28 cl, 10 dwg
