FIELD: chemistry.
SUBSTANCE: invention can be used to determine location of forsterite in material of a sample. Essence of invention consists in that, location of forsterite is inspected in an area from which is emitted light excited by electron beam, when forsterite-containing material is irradiated by electron beam. Present invention has a preferred application in cases when material is a sheet of textured electrical steel with a layer of forsterite. Furthermore, it is preferable for accelerating voltage to be equal to 10 kV or more, when electron beam is emitted, in cases when material is a sheet of textured electrical steel, having a stressed coating layer on layer of forsterite.
EFFECT: technical result is providing simple technique of checking presence of forsterite without destruction of inspected object.
15 cl, 11 dwg, 2 tbl
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Authors
Dates
2017-03-07—Published
2014-03-24—Filed