DEVICE FOR OBTAINING ELECTRON MICROSCOPIC IMAGE AND LOCAL ELEMENT ANALYSIS OF RADIOACTIVE SAMPLE BY ELECTRON MICROSCOPY IN RADIATION PROTECTION CHAMBER Russian patent published in 2019 - IPC G01T7/00 

Abstract RU 2678504 C1

FIELD: optics.

SUBSTANCE: invention relates to scanning electron microscopes (SEM) and is intended for obtaining an electron microscope image and local elemental analysis of a radioactive sample in a radiation protection chamber with data visualization on a computer screen. Essence of the invention lies in the fact that the device for obtaining an electron microscopic image and a local elemental analysis of a radioactive sample by electron microscopy in a radiation protection chamber contains an electronic unit, vacuum sensor, a wave dispersion spectrometer, a control unit and a turbomolecular pump equipped with lead radiation shielding screens against a radioactive sample under investigation placed on the working table of a microscope, in addition, the pen drive of the aperture unit is equipped with two electric drives for moving the apertures in two mutually perpendicular directions in the same plane, and the reverse-reflected-electron detector drive handle is electrically operated and with a toothed belt drive.

EFFECT: enhanced functionality through the use of an EMS in a radiation protection chamber.

1 cl, 5 dwg

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RU 2 678 504 C1

Authors

Sobolev Aleksej Aleksandrovich

Kiryukhin Vyacheslav Evgenevich

Makarychev Vyacheslav Vladimirovich

Svetukhin Vyacheslav Viktorovich

Zhukov Andrej Viktorovich

Fomin Aleksandr Nikolaevich

Vlasenko Vyacheslav Sergeevich

Ulyanenkov Aleksandr Georgievich

Dates

2019-01-29Published

2018-01-09Filed