ULTRASONIC INSPECTION DEVICE WITH LINEAR SCANNING AND ULTRASONIC INSPECTION METHOD WITH LINEAR SCANNING Russian patent published in 2019 - IPC G01N29/04 

FIELD: physics.

SUBSTANCE: use for ultrasonic inspection. Ultrasonic scanning device with linear scanning comprises: an ultrasound lattice probe having a plurality of ultrasound elements aligned in a first direction; delay time calculator configured to calculate, relative to the shape of the surface of the monitored object, delay time values of at least one of transmitting and receiving the ultrasonic wave; overlap region controller configured to establish conditions for generating an overlap area image; and an integrated image generator configured to generate first image data of an area including an overlap region. Area overlap regulator is configured to establish surface shape conditions, designated for delay time calculator when calculating delay time values either in first position of probe, or in second position of probe, as the first acquired form obtained in the first mounting position of the probe, and the second acquired shape obtained in the second mounting position of the probe.

EFFECT: possibility of linear scanning in a wide range.

8 cl, 36 dwg