FIELD: measurement technology.
SUBSTANCE: invention can be used for determination of coating thickness during plasma-electrolytic oxidation. Essence of the invention lies in the fact that the method of determining the thickness of the coating during plasma-electrolytic oxidation involves measuring a residual voltage value, characterized by that a residual value of voltage Ures at moment immediately before supply of positive voltage pulse after pause in pulsed unipolar mode and immediately before supply of negative voltage pulse after pause in pulsed bipolar mode, wherein thickness of coating is determined by a given formula.
EFFECT: possibility of increasing accuracy of determining thickness of coating, and, consequently, reducing amount of power consumption.
1 cl, 2 tbl, 7 dwg
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