FIELD: technological processes.
SUBSTANCE: invention relates to the field of electrochemical processing of materials and relates to a method for determining the thickness of a coating. Method comprises measuring 5 to 300 seconds after the radiation intensity of the part has been processed in a wavelength range of 3–50 nm, which includes the characteristic spectral emission line of the material of the component, located in the wavelength region 200–900 nm. In addition, the intensity of microdischarge radiation is measured in the wavelength range 3–50 nm, including the characteristic spectral emission line of one of the electrolyte components located in the wavelength range 200–900 nm. Thickness of the coating is determined by the formula: h=k1⋅(lnI1-lnI2)+k2, where k1 and k2 – empirical coefficients, depending on the nature of the material being processed and the composition of the electrolyte, determined by the calibration curves, I1 and I2 – intensity of the spectral lines of one of the electrolyte components and the material of the component, respectively.
EFFECT: technical result consists in increasing the accuracy of determining the thickness of the coating and ensuring the possibility of timely termination of the plasma electrolytic oxidation process.
2 cl, 10 dwg, 2 tbl
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Authors
Dates
2018-11-08—Published
2017-07-21—Filed