FIELD: electrochemical treatment.
SUBSTANCE: invention relates to electrochemical processing, particularly to plasma-electrolytic oxidation (PEO), and can be used to measure thickness of coating during PEO process. Method of determining thickness of coating during plasma-electrolytic oxidation includes measurement of radiant energy during production of coating, wherein after 1–50 s after the beginning of treatment, radiation is periodically recorded in the wavelength range of 200–1,100 nm with a width of the informative region of 50–900 nm at time intervals Δti with holding of 0.1–5 s, its average intensity is calculated, and the thickness of the coating is calculated is determined by formulas , where i is the number of the time interval; N is the total number of time intervals in the processing cycle; Δti is duration of time interval, s; is the average rate of growth of the coating on the time interval i, defined as the ratio of the difference in thickness of the coating on the current hi and previous hi-1 time intervals to the difference of the current ti and the previous ti-1 time intervals, mcm/s; Iav(i) is the average radiation intensity for the time interval i, having a stable correlation with the average growth rate νi, p.u.; k1 and k2 are empirical coefficients depending on the nature of the processed material and composition of the electrolyte, determined from calibration curves, mcm.
EFFECT: high accuracy of determining thickness of oxide coating for timely termination of plasma-electrolytic oxidation.
1 cl, 12 dwg, 2 tbl
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Authors
Dates
2024-09-05—Published
2024-02-19—Filed