SEMICONDUCTOR DEVICE Russian patent published in 2019 - IPC H01L29/78 

Abstract RU 2705761 C1

FIELD: electrical engineering.

SUBSTANCE: semiconductor device includes: groove electrode groove formed in contact with drift area, pocket area and source area; a gate electrode formed on the surface of the groove electrode groove through the insulating film; groove of source electrode in contact with groove of gate electrode; a source electrode electrically connected to the source region; and a gate conductor electrically isolated from the source electrode and formed inside the source electrode groove in contact with the gate electrode.

EFFECT: invention provides a semiconductor device adapted to reduce variation of threshold voltage.

8 cl, 20 dwg

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RU 2 705 761 C1

Authors

Tanaka, Ryota

Hayashi, Tetsuya

Ni, Wei

Hayami, Yasuaki

Dates

2019-11-11Published

2016-08-10Filed