FIELD: non-destructive quality control.
SUBSTANCE: invention is intended for non-destructive quality control of magnetic films by recording ferromagnetic resonance spectra in a wide frequency band from local areas of thin-film samples. The substance of the invention lies in the fact that a local broadband ferromagnetic resonance spectrometer contains a vector network analyzer, a short-circuited asymmetric strip line placed in an electromagnetic screen, controlled DC sources that feed two pairs of orthogonal Helmholtz rings, while a hole is made in the screen of an asymmetric strip line, and the sample thin magnetic film is placed on the outer side of the electromagnetic screen so that the test area of the sample is opposite the hole in the screen, while the device additionally contains a three-component magnetic system designed to compensate for the laboratory magnetic field.
EFFECT: providing the possibility of local measurements of the magnetic characteristics of thin-film samples.
1 cl, 9 dwg
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Authors
Dates
2022-11-29—Published
2022-05-27—Filed