FIELD: defectoscopy.
SUBSTANCE: use to adjust sensitivity of ultrasonic flaw detector. Essence of the invention consists in that the defectoscope transducer is emitted into a tuning sample and receives from the known reflector therein ultrasonic signals, estimating amplitude of ultrasonic signal received from known reflector, from which flaw detector sensitivity is corrected, for this purpose tuning sample with known reflector is installed on preliminary surface of controlled object, which is pre-lubricated with contact liquid, scanning of control object surface, determining the position, at which on the flaw detector screen the maximum amplitude of the ultrasonic signal received from the known reflector is observed, amplitude of ultrasonic signals is controlled proportionally to equivalent area of simulated defect and fixing at that amplification of flaw detector N0, then converter is installed on tuning sample, amplification N1 is determined, at which amplitude of ultrasonic signal reaches threshold level, removing the tuning sample from the monitoring object and repeatedly determining amplification N2, wherein the amplitude of the ultrasonic signal reaches a threshold level, correction to sensitivity of flaw detector is determined and flaw detector amplification is corrected by reduction of its value by correction value.
EFFECT: high accuracy of tuning sensitivity of the flaw detector.
1 cl, 3 dwg
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Authors
Dates
2020-07-10—Published
2019-12-31—Filed