FIELD: automatic test equipment.
SUBSTANCE: invention relates to the field of automatic test equipment for testing electronic semiconductor components, in particular to devices that generate digital test sequences with specified time parameters. To implement the effect, the claimed solution provides for a generator, a prototype signal shaper, adjustable delay lines, a multiplexer, as well as logic circuits "AND", "OR".
EFFECT: simplification of the formatter design.
4 cl, 4 dwg
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