FIELD: measuring equipment.
SUBSTANCE: invention relates to systems for measuring the parameters of electromagnetic (EM) radiation beams. The system for visualizing microwave radiation by registering a plasma image contains a metal-dielectric screen placed in a sealed chamber filled with working gas with an input window made of a material transparent to microwave radiation, while the input window is located in front of the working surface of the metal-dielectric screen at a distance from it at least 5 times smaller than the characteristic transverse beam size of the visualized microwave radiation, besides at least one of the parts of the chamber is made of material transparent in the visible range or those close to it.
EFFECT: expansion of the ranges in intensity, pulse duration and frequency of the visualized microwave radiation, an increase in the accuracy of visualization of the spatial structure of the beams of this microwave radiation.
16 cl, 12 dwg
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Authors
Dates
2021-12-14—Published
2021-03-02—Filed