METHOD OF DETERMINING RESISTANCE OF ELECTRONIC COMPONENTS AND UNITS OF RADIOELECTRONIC EQUIPMENT TO IONISING RADIATION Russian patent published in 2014 - IPC H01L21/66 

FIELD: physics.

SUBSTANCE: method involves using three parametric Weilbull distributions or a confidence interval the inner boundaries (u - lower and v - upper) of which are obtained based on processing experimental exposure data of a sample with a size n, outer boundaries (U - lower and V - upper) are set from common physical presentations, the defining presentations of which are the level of absence of observed critical changes and slight (20-30%) exceeding of requirements for resistance of units to the effect of ionising radiation; including the experimentally obtained integral function of distribution of lower acceptable levels of resistance to different types of ionising radiation in the selected boundaries (U, V); determining the rate of change of probability of parametric or functional failures (intensity of variation of the parametric resource); plotting a family of curves of the distribution function F(U, x) of different types of ionising radiations (neutron fluence (F_n); gamma/X-ray radiation dose rate (P_γ-x-Ray); full absorbed dose (D_γ-x-Ray); heavy charged particle fluence F_ion; linear energy loss value (LET) (for spacecraft-mounted equipment, etc) at fixed values ; determining from the plotted curves the radiation load level where the failure probability of the device is F_crit, or the operability maintenance resource R_sokhr=1-F_crit.

EFFECT: high reliability of determining resistance of electronic components and units of radioelectronic equipment to ionising radiation.

4 cl, 13 dwg, 2 tbl